A New Laboratory Designed to Provide an Optimum Environment for Aberration-Corrected Electron Microscopes
نویسندگان
چکیده
منابع مشابه
Intrinsic instability of aberration-corrected electron microscopes.
Aberration-corrected microscopes with subatomic resolution will impact broad areas of science and technology. However, the experimentally observed lifetime of the corrected state is just a few minutes. Here we show that the corrected state is intrinsically unstable; the higher its quality, the more unstable it is. Analyzing the contrast transfer function near optimum correction, we define an "i...
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The increasing use of environmental transmission electron microscopy (ETEM) in materials science provides exciting new possibilities for investigating chemical reactions and understanding both the interaction of fast electrons with gas molecules and the effect of the presence of gas on high-resolution imaging. A gaseous atmosphere in the pole-piece gap of the objective lens of the microscope al...
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Unlike light microscopy, where resolution is diffraction limited, the achievable resolution of electron microscopes is limited by lens aberrations so severe that the practical resolution is orders of magnitude worse than the diffraction limit. About 10 years ago, the first practical electron lens spherical aberration correctors were developed, and in the past decade, their performance, versatil...
متن کاملAberration-Corrected Electron Microscopy at Brookhaven National Laboratory
Notice: This manuscript has been authored by employees of Brookhaven Science Associates, LLC under Contract No. DE-AC02-98CH10886 with the U.S. Department of Energy. The publisher by accepting the manuscript for publication acknowledges that the United States Government retains a non-exclusive, paid-up, irrevocable, world-wide license to publish or reproduce the published form of this manuscrip...
متن کاملAberration-corrected precession electron diffraction
Precession electron diffraction (PED) is a promising technique for collecting high quality diffraction patterns for rapid nanoscale structural characterization [1]. It is able to reduce dynamical scattering effects, improving the interpretability of diffraction intensities over those obtained by conventional electron diffraction techniques. When used on a microscope that can produce a fine prob...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2002
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927602105332